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在现场可编程门阵列中用于降低泄漏功率的动态电源门控
常规文章 | Updated:2023-05-08
    • 在现场可编程门阵列中用于降低泄漏功率的动态电源门控

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    • Dynamic power-gating for leakage power reduction in FPGAs

    • 信息与电子工程前沿(英文版)   2023年24卷第4期 页码:582-598
    • DOI:10.1631/FITEE.2200084    

      中图分类号: TN79
    • 收稿:2022-03-05

      修回:2022-10-10

      纸质出版:2023-04-0

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  • Hadi JAHANIRAD. 在现场可编程门阵列中用于降低泄漏功率的动态电源门控[J]. 信息与电子工程前沿(英文版), 2023,24(4):582-598. DOI: 10.1631/FITEE.2200084.

    Hadi JAHANIRAD. Dynamic power-gating for leakage power reduction in FPGAs[J]. Frontiers of Information Technology & Electronic Engineering, 2023, 24(4): 582-598. DOI: 10.1631/FITEE.2200084.

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