Determination of cut-off time of accelerated aging test under temperature stress for LED lamps

Jian HAO; Lei JING; Hong-liang KE; Yao WANG; Qun GAO; Xiao-xun WANG; Qiang SUN; Zhi-jun XU

doi:10.1631/FITEE.1500483

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Determination of cut-off time of accelerated aging test under temperature stress for LED lamps

Regular Papers | Updated：2022-05-19

- Determination of cut-off time of accelerated aging test under temperature stress for LED lamps
- LED灯具温度应力加速老化截止时间的确定
- Frontiers of Information Technology & Electronic Engineering Vol. 18, Issue 8, Pages: 1197-1204(2017)
- Affiliations：
  
  University of Chinese Academy of Sciences, Beijing 100049, China
  Science and Technology on Vacuum Technology and Physics Laboratory, Lanzhou Institute of Physics, CAST, Lanzhou 730000, China
  Opto-Electronics Technology Center, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
- Author bio：
  
  Qiang SUN, E-mail: sunq@ciomp.ac.cn
- Funds：
- DOI：10.1631/FITEE.1500483
  CLC： O439
- Received：28 December 2015，
  
  Revised：2017-;8-14，
  
  Published：2017-08
- Accepted：
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Jian HAO, Lei JING, Hong-liang KE, et al. Determination of cut-off time of accelerated aging test under temperature stress for LED lamps[J]. Frontiers of Information Technology & Electronic Engineering, 2017, 18(8): 1197-1204.
DOI：

Jian HAO, Lei JING, Hong-liang KE, et al. Determination of cut-off time of accelerated aging test under temperature stress for LED lamps[J]. Frontiers of Information Technology & Electronic Engineering, 2017, 18(8): 1197-1204. DOI： 10.1631/FITEE.1500483.

摘要

在LED灯具加速老化过程中，为获得最小截止时间，对其寿命进行快速预估，本文采用5阶滑动平均误差方法分析数据。选用同批次的16个样本，分别进行80°C和85°C应力条件下的加速老化。首先，采用e指数对光通维持率进行拟合，获得每个灯具的加速寿命，进而采用威布尔分布对加速寿命进行拟合，获得中位寿命。其次，采用平均滑动误差方法，可获取不同截止时间下中位寿命预估误差。结果表明：加速老化过程中，存在最小截止时间，该时间可通过滑动平均误差和截止时间的关系确定；当截止时间小于该值时，寿命预估不合理；寿命预估误差随截止时间增加而逐渐减小。对于该类LED灯具，80℃时最小截止时间为1104小时，寿命预估误差为1.15%；85°C时最小截止时间为936小时，寿命预估误差为1.24%。当寿命估计误差约为0.46％时，80°C和85°C对应的中位寿命分别为7310小时和4598小时。

Abstract

To acquire a rational minimum cut-off time and the precision of lifetime prediction with respect to cut-off time for the accelerated aging test of LED lamps

fifth-order moving average error estimation is adopted in this paper. Eighteen LED lamps from the same batch are selected for two accelerated aging tests

with 10 samples at 80 ℃ and eight samples at 85 ℃. First

the accelerated lifetime of each lamp is acquired by exponential fitting of the lumen maintenances of the lamp for a certain cut-off time. With the acquired lifetimes of all lamps

the two-parameter Weibull distribution of the failure probability is obtained

and the medium lifetime is calculated. Then

the precision of the medium lifetime prediction for different cut-off times is obtained by moving average error estimation. It is shown that there exists a minimum cut-off time for the accelerated aging test

which can be determined by the variation of the moving average error versus the cut-off time. When the cut-off time is less than this value

the lifetime estimation is irrational. For a given cut-off time

the precision of lifetime prediction can be computed by average error evaluation

and the error of lifetime estimation decreases gradually as the cut-off time increases. The minimum cut-off time and medium lifetime of LED lamps are both sensitive to thermal stress. The minimum cut-off time is 1104 h with the lifetime estimation error of 1.15% for the test at 80 ℃

and 936 h with the lifetime estimation error of 1.24% for the test at 85 ℃. With the lifetime estimation error of about 0.46%

the median lifetimes are 7310 h and 4598 h for the tests at 80 ℃ and 85℃

respectively.

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