

FOLLOWUS
Center of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China
Key Lab of Ultra-precision Intelligent Instrumentation, Ministry of Industry and Information Technology, Harbin 150080, China
Jiu-bin TAN, E-mail: jbtan@hit.edu.cn
Received:07 November 2018,
Revised:2019-;5-;8,
Published:2019-05
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Peng-cheng HU, Di CHANG, Jiu-bin TAN, et al. Displacement measuring grating interferometer: a review[J]. Frontiers of Information Technology & Electronic Engineering, 2019, 20(5): 631-654.
Peng-cheng HU, Di CHANG, Jiu-bin TAN, et al. Displacement measuring grating interferometer: a review[J]. Frontiers of Information Technology & Electronic Engineering, 2019, 20(5): 631-654. DOI: 10.1631/FITEE.1800708.
A grating interferometer
called the "optical encoder
" is a commonly used tool for precise displacement measurements. In contrast to a laser interferometer
a grating interferometer is insensitive to the air refractive index and can be easily applied to multi-degree-of-freedom measurements
which has made it an extensively researched and widely used device. Classified based on the measuring principle and optical configuration
a grating interferometer experiences three distinct stages of development: homodyne
heterodyne
and spatially separated heterodyne. Compared with the former two
the spatially separated heterodyne grating interferometer could achieve a better resolution with a feature of eliminating periodic nonlinear errors. Meanwhile
numerous structures of grating interferometers with a high optical fold factor
a large measurement range
good usability
and multi- degree-of-freedom measurements have been investigated. The development of incremental displacement measuring grating interferometers achieved in recent years is summarized in detail
and studies on error analysis of a grating interferometer are briefly introduced.
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