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Long working distance portable smartphone microscopy for metallic mesh defect detection
Regular Papers | Updated：2025-07-28

    • Long working distance portable smartphone microscopy for metallic mesh defect detection

      Enhanced Publication
    • 基于长工作距便携式智能手机显微镜的金属网栅缺陷检测技术
    • “In the field of in situ industrial product inspection, a novel long-working-distance reflective smartphone microscopy (LD-RSM) system has been proposed. Expert established the LD-RSM system, which provides solutions to solve the limitations of existing smartphone microscopes for industrial in situ inspection.”
    • Frontiers of Information Technology & Electronic Engineering   Vol. 26, Issue 7, Pages: 1131-1143(2025)

    • DOI：10.1631/FITEE.2401002    

      CLC： TP391.41

    • Received：13 November 2024，

      Revised：2025-01-13，

      Published：2025-07

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  • Zhengang LU, Hongsheng QIN, Jing LI, et al. Long working distance portable smartphone microscopy for metallic mesh defect detection[J]. Frontiers of Information Technology & Electronic Engineering, 2025, 26(7): 1131-1143. DOI： 10.1631/FITEE.2401002.

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