Fa-en LIU, Zhi-gong WANG, Zhi-qun LI, et al. A 31-45.5 GHz injection-locked frequency divider in 90-nm CMOS technology[J]. Frontiers of Information Technology & Electronic Engineering, 2014, 15(12): 1183-1189.
DOI:
Fa-en LIU, Zhi-gong WANG, Zhi-qun LI, et al. A 31-45.5 GHz injection-locked frequency divider in 90-nm CMOS technology[J]. Frontiers of Information Technology & Electronic Engineering, 2014, 15(12): 1183-1189. DOI: 10.1631/jzus.C1400080.
A 31-45.5 GHz injection-locked frequency divider in 90-nm CMOS technology
We present a 31–45.5 GHz injection-locked frequency divider (ILFD) implemented in a standard 90-nm CMOS process. To reduce parasitic capacitance and increase the operating frequency
an NMOS-only cross-coupled pair is adopted to provide negative resistance. Acting as an adjustable resistor
an NMOS transistor with a tunable gate bias voltage is connected to the differential output terminals for locking range extension. Measurements show that the designed ILFD can be fully functional in a wide locking range and provides a good figure-of-merit. Under a 1 V tunable bias voltage
the self-resonant frequency of the divider is 19.11 GHz and the maximum locking range is 37.7% at 38.5 GHz with an input power of 0 dBm. The power consumption is 2.88 mW under a supply voltage of 1.2 V. The size of the chip including the pads is 0.62 mm×0.42 mm.
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references
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