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Examination of the wavelet-based approach for measuring self-similarity of epileptic electroencephalogram data
Electronic Engineering | Updated:2022-05-19
    • Examination of the wavelet-based approach for measuring self-similarity of epileptic electroencephalogram data

    • 基于小波分析的癫痫脑电图自相似性测量
    • Frontiers of Information Technology & Electronic Engineering   Vol. 15, Issue 12, Pages: 1147-1153(2014)
    • DOI:10.1631/jzus.C1400126    

      CLC: TN911.7;R318
    • Received:05 April 2014,

      Revised:2014-11-18,

      Published:2014-12

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  • Suparerk JANJARASJITT. Examination of the wavelet-based approach for measuring self-similarity of epileptic electroencephalogram data[J]. Frontiers of Information Technology & Electronic Engineering, 2014, 15(12): 1147-1153. DOI: 10.1631/jzus.C1400126.

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