考虑设计参数扰动的芯片多元参数成品率预测算法

Xin LI; Jin SUN; Fu XIAO

doi:10.1631/FITEE.1601225

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考虑设计参数扰动的芯片多元参数成品率预测算法

常规文章 | Updated：2022-05-19

- 考虑设计参数扰动的芯片多元参数成品率预测算法
- Antenna-in-package system integrated with meander line antenna based on LTCC technology
- 信息与电子工程前沿（英文） 2016年17卷第12期页码：1344-1359
- Affiliations：
  
  1Jiangsu High Technology Research Key Laboratory for Wireless Sensor Networks, Nanjing University of Posts and Telecommunications, Nanjing 210013, China
  2Technology Innovation Center, Jiangsu Academy of Safety Science and Technology, Nanjing 210042, China
  3School of Computer Science and Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
- Author bio：
  
  E-mail:lin65002@hotmail.com
- Funds：
  
  Project supported by the Natural Science Foundation of Jiangsu Province (Nos. BK20161072, BK20150785, and BK20130877) and the National Natural Science Foundation of China (Nos. 61502234 and 71301081)
- DOI：10.1631/FITEE.1601225
  中图分类号： TP312
- 收稿：2015-05-16，
  
  录用：2016-9-11，
  
  纸质出版：2016-12
- Accepted：
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考虑设计参数扰动的芯片多元参数成品率预测算法[J]. 信息与电子工程前沿（英文）, 2016,17(12):1344-1359.

Xin LI, Jin SUN, Fu XIAO. Antenna-in-package system integrated with meander line antenna based on LTCC technology[J]. Frontiers of Information Technology & Electronic Engineering, 2016, 17(12): 1344-1359.
考虑设计参数扰动的芯片多元参数成品率预测算法[J]. 信息与电子工程前沿（英文）, 2016,17(12):1344-1359. DOI： 10.1631/FITEE.1601225.

Xin LI, Jin SUN, Fu XIAO. Antenna-in-package system integrated with meander line antenna based on LTCC technology[J]. Frontiers of Information Technology & Electronic Engineering, 2016, 17(12): 1344-1359. DOI： 10.1631/FITEE.1601225.

摘要

随着芯片制造工艺的进步，工艺参数、供电电压及片上温度（Process

voltage

and temperature

PVT）等设计参数扰动已成为芯片设计过程的棘手问题，其所产生的性能指标间相关性将导致芯片参数成品率显著下降。但是，当前芯片参数成品率预测算法主要局限于单一性能指标成品率预测或对多个单性能指标成品率进行均衡优化，而不能同时针对多个性能指标约束进行多元参数成品率预测，易造成参数成品率精度缺失。基于以上问题，本文将多个性能指标同时作为约束条件，提出一种芯片多元参数成品率预测方法。该方法首先考虑PVT参数扰动，利用自适应弹性网（Adaptive elastic net

AEN）对芯片性能指标进行建模。然后，基于乘法定理及马尔科夫链蒙特卡罗法，通过求解累积分布函数（Cumulative distribution function

CDF）对单一性能指标的芯片参数成品率进行预测。最后，同时考虑多个芯片性能指标约束，根据Copula方法准确预测芯片多元参数成品率。实验结果表明，本文方法可以在指定性能指标约束下对芯片多元参数成品率进行有效预测，并可为芯片设计人员提供任意性能指标约束下的多元参数成品率预测曲面。

Abstract

We investigate the secrecy outage performance of maximal ratio combining (MRC) in cognitive radio networks over Rayleigh fading channels. In a single-input multiple-output wiretap system

we consider a secondary user (SU-TX) that transmits confidential messages to another secondary user (SU-RX) equipped with

(

≥1) antennas where the MRC technique is adopted to improve its received signal-to-noise ratio. Meanwhile

an eavesdropper equipped with

(

≥1) antennas adopts the MRC scheme to overhear the information between SU-TX and SU-RX. SU-TX adopts the underlay strategy to guarantee the service quality of the primary user without spectrum sensing. We derive the closed-form expressions for an exact and asymptotic secrecy outage probability.

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