基于元胞自动机的电阻存储器多比特固定型故障诊断

Sutapa SARKAR; Biplab Kumar SIKDAR; Mousumi SAHA

doi:10.1631/FITEE.2100255

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基于元胞自动机的电阻存储器多比特固定型故障诊断

常规文章 | Updated：2022-09-08

- 基于元胞自动机的电阻存储器多比特固定型故障诊断
  Enhanced Publication
- Cellular automata based multi-bit stuck-at fault diagnosis for resistive memory
- 信息与电子工程前沿（英文） 2022年23卷第7期页码：1110-1126
- Affiliations：
  
  1.Department of Electronics and Communication Engineering, Seacom Engineering College, Howrah, West Bengal711302, India
  2.Department of Computer Science and Technology, Indian Institute of Engineering Science and Technology, Howrah, West Bengal711103, India
  3.Department of Computer Science and Engineering, National Institute of Technology, Durgapur, West Bengal713209, India
- Author bio：
  
  ‡Corresponding authors
  E-mail: biplab@cs.iiests.ac.in;
  E-mail: msaha.nitd@gmail.com
- Funds：
- DOI：10.1631/FITEE.2100255
  中图分类号： TP333
- 纸质出版日期：2022-07-23，
  
  收稿日期：2021-05-26，
  
  录用日期：2021-10-07
- Accepted：
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Sutapa SARKAR, Biplab Kumar SIKDAR, Mousumi SAHA. 基于元胞自动机的电阻存储器多比特固定型故障诊断[J]. 信息与电子工程前沿（英文）, 2022,23(7):1110-1126.

SUTAPA SARKAR, BIPLAB KUMAR SIKDAR, MOUSUMI SAHA. Cellular automata based multi-bit stuck-at fault diagnosis for resistive memory. [J]. Frontiers of information technology & electronic engineering, 2022, 23(7): 1110-1126.
Sutapa SARKAR, Biplab Kumar SIKDAR, Mousumi SAHA. 基于元胞自动机的电阻存储器多比特固定型故障诊断[J]. 信息与电子工程前沿（英文）, 2022,23(7):1110-1126. DOI： 10.1631/FITEE.2100255.

SUTAPA SARKAR, BIPLAB KUMAR SIKDAR, MOUSUMI SAHA. Cellular automata based multi-bit stuck-at fault diagnosis for resistive memory. [J]. Frontiers of information technology & electronic engineering, 2022, 23(7): 1110-1126. DOI： 10.1631/FITEE.2100255.

摘要

本文提出一种用于可变电阻式存储器（ReRAM）、基于组的动态固定型故障诊断方案。传统的静态随机存取存储器、动态随机存取存储器、NAND和NOR闪存受可扩展性、功率、封装密度等限制。可变电阻式存储器这类下一代存储器被认为具有多种优势，如高封装密度、非易失性、可扩展性和低功耗，但单元可靠性一直是个问题。不可靠的内存操作是由于大量使用写入或内存密集型工作负载而导致的永久性固定型故障。越来越多的固定型故障也限制了芯片寿命。因此，本文提出一种基于元胞自动机（CA）的动态消除固定型故障设计，以解决不可靠的电池功能和不稳定的电池寿命问题。引入可扩展的块级故障诊断和恢复方案，以确保在出现多比特固定型故障情形下仍可读取数据。该方案是一种新颖方法，因其目标是消除一般故障条件下对固定型故障的数量和性质的限制。所提方案基于Wolfram零边界和周期性边界CA理论。引入多种特殊类别CA——单长循环单吸引子元胞自动机（SACA）、单长循环双吸引子元胞自动机（TACA）和单长循环多吸引子元胞自动机（MACA）——以实现完全容错。目标微架构单元设计具有最佳空间开销。

Abstract

This paper presents a group-based dynamic stuck-at fault diagnosis scheme intended for resistive random-access memory (ReRAM). Traditional static random-access memory

dynamic random-access memory

NAND

and NOR flash memory are limited by their scalability

power

package density

and so forth. Next-generation memory types like ReRAMs are considered to have various advantages such as high package density

non-volatility

scalability

and low power consumption

but cell reliability has been a problem. Unreliable memory operation is caused by permanent stuck-at faults due to extensive use of write- or memory-intensive workloads. An increased number of stuck-at faults also prematurely limit chip lifetime. Therefore

a cellular automaton (CA) based dynamic stuck-at fault-tolerant design is proposed here to combat unreliable cell functioning and variable cell lifetime issues. A scalable

block-level fault diagnosis and recovery scheme is introduced to ensure readable data despite multi-bit stuck-at faults. The scheme is a novel approach because its goal is to remove all the restrictions on the number and nature of stuck-at faults in general fault conditions. The proposed scheme is based on Wolfram's null boundary and periodic boundary CA theory. Various special classes of CAs are introduced for 100% fault tolerance: single-length-cycle single-attractor cellular automata (SACAs)

single-length-cycle two-attractor cellular automata (TACAs)

and single-length-cycle multiple-attractor cellular automata (MACAs). The target micro-architectural unit is designed with optimal space overhead.

关键词

电阻存储器电池可靠性块级故障诊断单长循环单吸引子元胞自动机单长循环双吸引子元胞自动机单长循环多吸引子元胞自动机

Keywords

Resistive memoryCell reliabilityStuck-at fault diagnosisSingle-length-cycle single-attractor cellular automataSingle-length-cycle two-attractor cellular automataSingle-length-cycle multiple-attractor cellular automata

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