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Electrical characterization of integrated passive devices using thin film technology for 3D integration
中国微纳技术学会专题,CSMNT2012 | Updated:2022-12-09
    • Electrical characterization of integrated passive devices using thin film technology for 3D integration

    • Electrical characterization of integrated passive devices using thin film technology for 3D integration

    • 信息与电子工程前沿(英文)   2013年14卷第4期 页码:235-243
    • DOI:10.1631/jzus.C12MNT01    

      中图分类号: TN405
    • 收稿:2012-10-18,

      修回:2013-;3-15,

      纸质出版:2013-04

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  • Electrical characterization of integrated passive devices using thin film technology for 3D integration[J]. 信息与电子工程前沿(英文), 2013,14(4):235-243. DOI: 10.1631/jzus.C12MNT01.

    Xin SUN, Yun-hui ZHU, Zhen-hua LIU, et al. Electrical characterization of integrated passive devices using thin film technology for 3D integration[J]. Frontiers of Information Technology & Electronic Engineering, 2013, 14(4): 235-243. DOI: 10.1631/jzus.C12MNT01.

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