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Data-driven intermittent connection fault diagnosis for complex topology DeviceNet based on Bayesian inference
Regular Papers | Updated：2025-07-28

    • Data-driven intermittent connection fault diagnosis for complex topology DeviceNet based on Bayesian inference

      Enhanced Publication
    • 基于贝叶斯推断的数据驱动复杂拓扑DeviceNet间歇性连接故障诊断方法
    • “In the field of industrial automation systems, a novel data-driven intermittent connection fault diagnosis method based on Bayesian inference is proposed for DeviceNet with complex topologies. This method can accurately and efficiently localize all IC faults in the network without interrupting the normal system operation, providing solutions to solve IC fault diagnosis problems in complex DeviceNet systems.”
    • Frontiers of Information Technology & Electronic Engineering   Vol. 26, Issue 7, Pages: 1194-1208(2025)

    • DOI：10.1631/FITEE.2400696    

      CLC： TP277

    • Received：08 August 2024，

      Revised：2024-11-11，

      Published：2025-07

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  • Longkai WANG, Yong LEI. Data-driven intermittent connection fault diagnosis for complex topology DeviceNet based on Bayesian inference[J]. Frontiers of Information Technology & Electronic Engineering, 2025, 26(7): 1194-1208. DOI： 10.1631/FITEE.2400696.

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