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Effective fault detection in M3D ICs: a cluster-based BIST for enhanced inter-layer via fault coverage
Regular Papers | Updated：2025-11-18

    • Effective fault detection in M3D ICs: a cluster-based BIST for enhanced inter-layer via fault coverage

    • 单片三维集成电路高效故障检测方法：基于簇的内建自测以提升层间通孔故障覆盖率
    • “In the field of monolithic 3D integrated circuits, a novel built-in self-test architecture has been introduced to efficiently detect inter-layer via defects, particularly in irregularly positioned ILVs, and approximately localize them within clusters. This strategy empowers designers to fine-tune fault coverage, localization precision, and test duration to meet specific design requirements.”
    • Frontiers of Information Technology & Electronic Engineering   Vol. 26, Issue 10, Pages: 2041-2063(2025)

    • DOI：10.1631/FITEE.2401094    

      CLC： TN407

    • Received：26 December 2024，

      Revised：2025-06-24，

      Published：2025-10

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  • Hadi JAHANIRAD, Ahmad MENBARI, Hemin RAHIMI, et al. Effective fault detection in M3D ICs: a cluster-based BIST for enhanced inter-layer via fault coverage[J]. Frontiers of Information Technology & Electronic Engineering, 2025, 26(10): 2041-2063. DOI： 10.1631/FITEE.2401094.

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